A technique using electron beams to image materials at high resolution.Electron microscopy is a family of techniques that use a beam of electrons to image objects at resolutions far beyond the limit of optical microscopes. Because electrons have a much shorter wavelength than visible light, they can resolve details down to the atomic scale. This has revolutionized biology, materials science, and nanotechnology by allowing direct visualization of viruses, molecules, and crystal defects.
The first electron microscope was built by Ernst Ruska and Max Knoll in 1931, for which Ruska received the Nobel Prize in Physics in 1986.
A beam of electrons is focused by electromagnetic lenses onto a thin specimen. The electrons interact with the sample, being scattered or absorbed, and the resulting pattern is magnified and projected onto a detector to form an image. In scanning electron microscopy (SEM), the beam is rastered across the surface, and secondary electrons are collected to build a topographical image. In transmission electron microscopy (TEM), electrons pass through the sample, revealing internal structure.
Used extensively in materials science to characterize nanostructures, in biology to image cellular organelles, and in the semiconductor industry for quality control of microchips.
The resolution of a modern electron microscope is so high that it can image individual atoms, making it possible to see the positions of atoms in a crystal lattice.











