An optical microscopy technique that uses magnetic fields or magnetic probes to image samples at high resolution.Magnetic optical microscopy is a family of imaging techniques that combine optical microscopy with magnetic sensitivity to visualize magnetic fields, magnetic domains, or magnetic nanoparticles in a sample. Unlike traditional optical microscopy, which relies on light absorption or reflection, these methods detect how magnetic structures alter the polarization, phase, or intensity of light, or how they interact with a magnetic probe. This allows researchers to see magnetic patterns at the microscale or even nanoscale, revealing the hidden magnetic 'landscape' of materials, biological cells, or electronic devices.
The magneto-optical Kerr effect was discovered by John Kerr in 1877, but its application to microscopy began in the 1950s with the development of the Kerr microscope. Magnetic force microscopy was introduced in 1987 by Y. Martin and H. K. Wickramasinghe, building on atomic force microscopy technology.
One common approach uses the magneto-optical Kerr effect: when polarized light reflects off a magnetized surface, its polarization rotates slightly, and the rotation angle depends on the local magnetization direction. By scanning a laser beam across the sample and measuring the polarization change, a map of magnetic domains is built. Another technique, magnetic force microscopy, uses a sharp magnetic tip on a cantilever that feels forces from the sample's magnetic field, with the deflection detected optically. In both cases, the optical readout provides high spatial resolution and sensitivity to magnetic signals.
Magnetic optical microscopy is used in the semiconductor industry to inspect magnetic storage media, in biology to track magnetic nanoparticles inside cells, and in fundamental physics to study magnetic skyrmions and other exotic spin textures.
Using the Kerr effect, scientists can image magnetic domains in real time while the sample is inside a scanning electron microscope, combining magnetic and topographical information in a single instrument.
| τ | variable | optical depth — optical depth |
| n | variable | number density of absorbers — number density per cubic metre |
| σ | variable | cross-section per absorber — cross section square metre |
| l | variable | path length through the medium — length metre |















